The
unique technology incorporated in the Nova NanoSEM also suppresses
electron -beam induced contamination resulting from previous sample processing
steps.

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The Nova NanoSEM brings new capabilities to researchers and developers
working with non-conductive and contaminating nanoscale materials.com.

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The growing complexity and shrinking dimensions of materials, devices and
biological samples, have resulted in increased demand for nanoscale
characterization tools across all markets served by FEI.

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- Extensively illustrated throughout with over 200 figures , 400 tables,
and 3,000 references., FEI Company
(Nasdaq: FEIC) today released the newest member of its Nova(TM) family of SEM
and DualBeam(TM) systems, the Nova NanoSEM. This newest system joins FEI's growing line of market-leading tools
that are enabling nanoscale research, development and manufacturing in a
diverse range of markets and applications.

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Contents include the following:

1 INTRODUCTION
Additives
Plastics formulations
Economic impact of polymer additives
Analysis of plastics

2 DEFORMULATION PRINCIPLES
Polymer identification
Additive analysis of rubbers: "Best Practice"
Polymer extract analysis
In situ polymer/additive analysis
Class-specific polymer/additive analysis

3 SAMPLE PREPARATION PERSPECTIVES
Solvents
Extraction strategy
Conventional extraction technologies
High-pressure extraction methods
Sorbent extraction
Methodological comparison of extraction methods
Polymer/additive dissolution methods
Hydrolysis

4 SEPARATION TECHNIQUES
Analytical detectors
Gas chromatography
Supercritical fluid chromatography
Liquid chromatography techniques
Capillary electrophoretic techniques

5 POLYMER/ADDITIVE ANALYSIS: THE SPECTROSCOPIC ALTERNATIVE
Ultraviolet/visible spectrophotometry
Infrared spectroscopy
Luminescence spectroscopy
High-resolution nuclear magnetic resonance spectroscopy

6 ORGANIC MASS SPECTROMETRIC METHOD
Basic instrumentation
Ion sources
Mass analysers
Direct mass spectrometric polymer compound analysis
Ion mobility spectrometry

7 MULTIHYPHENATION AND MULTIDIMENSIONALITY IN POLYMER/ADDITIVE ANALYSIS
Precolumn hyphenation
Coupled sample preparation - spectroscopy/spectrometry
Postcolumn hyphenation
Multidimensional chromatography
Multidimensional spectroscopy

8 INORGANIC AND ELEMENTAL ANALYTICAL METHODS
Element analytical protocols
Sample destruction for classical elemental analysis
Analytical atomic spectrometry
X-ray spectrometry
Inorganic mass spectrometry
Radioanalytical and nuclear analytical methods
Electroanalytical techniques
Solid-state speciation analysis

9 DIRECT METHODS OF DEFORMULATION OF POLYMER/ADDITIVE DISSOLUTIONS
Chromatographic methods
Spectroscopic methods
Mass spectrometric method

10 A VISION FOR THE FUTURE
Trends in polymer technology
Trends in additive technology
Environmental, legislative and regulatory constraints
Analytical consequences
Epilogue

Appendix I List of Symbols
Appendix II Functionality of Common Additives
Appendix III Excerpt of Polymer Additive Database
Subject Index

For more information visit
http://www.

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The combined effect
delivers ultra-high resolution, low-vacuum characterization capabilities in an
environment that suppresses charge build-up on non-conductive materials.

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com/cgi -bin/prnh/20040820/RESEARCH )
This industrially relevant resource covers all established and emerging
analytical methods for the reformulation of polymeric materials, with emphasis
on the non-polymeric components.

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com/reports/c18795

Laura Wood
Senior Manager
Research and Markets
press@researchandmarkets. With R+D centers
in North America and Europe and sales and service operations in more than
40 countries around the world, FEI is bringing the nanoscale within the grasp
of leading researchers and manufacturers and helping to turn some of the
biggest ideas of this century into reality.feicompany.

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com/reports/c18795) has announced the addition
of Additives in Polymers to their offering.

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New System is the World's First SEM for Ultra-High Resolution Characterization
of Non-Conductive or Contaminating Samples

HILLSBORO, Ore.

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Research and Markets: Coverage on the Reformulation of Polymeric Materials Zoning in on Non-Polymeric Components

With
the Nova NanoSEM and its other tools for enabling nanotechnology, FEI
continues to lead advances in ultra-high resolution characterization and
analysis of a wide variety of samples at nanoscale dimensions.

About FEI
FEI's Tools for Nanotech(TM), featuring focused ion- and electron -beam
technologies, deliver 3D characterization, analysis and modification
capabilities with resolution down to the sub-Angstrom level.

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Scope
- Each technique is evaluated on its technical and industrial merits.
"The Nova NanoSEM, with its proprietary optics and detection systems, was
developed to meet the growing needs of customers who are faced with evolving
applications and expanding challenges," commented Tony Edwards, FEI's business
line manager for SEM and small DualBeam products.

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(Logo: http://www."
The Nova NanoSEM also features in-lens as well as low-vacuum secondary and
back scatter electron (BSE) imaging modes, and FEI's proprietary beam gas
chemistries for e-beam writing of nanostructures, making it the ideal SEM for
research and advanced study of nano-structures and nano-materials. More information can be found on
the FEI website at: http://www.

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researchandmarkets.

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researchandmarkets.

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It is the world's first
low-vacuum, field emission scanning electron microscope (FEG-SEM) solution for
ultra-high resolution characterization of charging and/or contaminating
samples such as organic materials, substrates, porous materials , plastics and
polymers.

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FEI's Helix
detector technology, introduced with the Nova NanoSEM, combines magnetic
immersion lens and low-vacuum SEM technologies for the first time in the
history of field emission scanning electron microscopy. "FEI led the market with its
ESEM technology for charging and non-coated samples.

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Now it extends its
leadership by combining the most advanced low-vacuum and ultra-high resolution
design features for these challenging yet critical sample types .

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DUBLIN, Ireland, Research and Markets
(http://www.
- Emphasis is on understanding (principles and characteristics) and
industrial applicability.

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newscom. In 2004, FEI was the
first electron optics manufacturer to deliver sub-Angstrom or atomic scale
resolution on a commercially available transmission electron microscope.

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com
Fax: +353 1 4100 980